Name: Scanning Probe Microscopy: The Lab on a Tip (en Inglés)
Price: 309.72 PEN
Availability: InStock
Author: Meyer, Ernst ; Bennewitz, Roland ; Hug, Hans J.
ISBN: 9783030370916

portada Scanning Probe Microscopy: The Lab on a Tip (en Inglés)

Formato

Libro Físico

Autor

Ernst Meyer

Roland Bennewitz

Hans J. Hug

Editorial

Springer

Idioma

Inglés

N° páginas

322

Encuadernación

Tapa Blanda

Dimensiones

23.4 x 15.6 x 1.8 cm

Peso

0.47 kg.

ISBN13

9783030370916

N° edición

0002

Categorías

Análisis espectral | espectroquímica
Instrumentos e instrumentación
Ingeniería aplicada de revestimientos de superficies, capas y películas

Scanning Probe Microscopy: The Lab on a Tip (en Inglés)

Ernst Meyer (Autor) · Roland Bennewitz (Autor) · Hans J. Hug (Autor) · Springer · Tapa Blanda

Libro Físico

S/ 309,72

S/ 619,44

Ahorras: S/ 309,72

50% descuento

Cantidad
Estado: Nuevo

Envío normal

Origen: Estados Unidos (Costos de importación incluídos en el precio)

Se enviará desde nuestra bodega entre el Lunes 10 de Junio y el Lunes 24 de Junio.

Lo recibirás en cualquier lugar de Perú entre 2 y 5 días hábiles luego del envío.

Reseña del libro "Scanning Probe Microscopy: The Lab on a Tip (en Inglés)"

Written by three leading experts in the field, this book describes and explains all essential aspects of scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods described. The book covers not only the physical principles behind this popular technique, but also tackles questions on instrument design, the basic features of the different imaging modes, and recurring artifacts. Novel applications and the latest research results are presented, and the book closes with a look at the future prospects of scanning probe microscopy, while also discussing related techniques in the field of nanoscience. This second edition includes essential scientific updates reflecting the latest research, as well as coverage of new breakthroughs in techniques such as submolecular imaging by atomic force microscopy (AFM), multifrequency AFM, high-speed imaging of biological matter, scanning x-ray microscopy, andtip-enhanced Raman scattering. The book serves as a general, hands-on guide for all types of classes that address scanning probe microscopy. It is ideally suited for graduate and advanced undergraduate students, either for self-study or as a textbook for a dedicated course on the topic. Furthermore, it is an essential component of any scanning probe microscopy laboratory course and a valuable resource for practicing researchers developing and using scanning probe techniques.