Name: in-situ electron microscopy: applications in physics, chemistry and materials science
SKU: 10761439
Price: 538.35 PEN
Availability: InStock
Author: gerhard dehm, james m. howe, josef zweck
ISBN: 9783527319732

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portada in-situ electron microscopy: applications in physics, chemistry and materials science

in-situ electron microscopy: applications in physics, chemistry and materials science

Formato

Libro Físico

Editorial

wiley-vch

Autor

gerhard dehm, james m. howe, josef zweck

N° páginas

402

ISBN

3527319735

ISBN13

9783527319732

Categorías

Ciencia de materiales

in-situ electron microscopy: applications in physics, chemistry and materials science

Gerhard Dehm, James M. Howe, Josef Zweck (Autor) · wiley-vch · Libro Físico

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Reseña del libro "in-situ electron microscopy: applications in physics, chemistry and materials science"

the book explains firstly the basic principles of modern focused ion beam workstations (fib), scanning electron microscopes (sem) and transmission electron microscopes (tem) and subsequently what kind of in-situ experiments can be performed to obtain information on the various material properties. information on the test techniques, data evaluation, and interpretation of the obtained results is provided by leading experts in the field.